Authors

Fadida, Sivan; Palumbo, F; Nyns, Laura; Lin, Dennis; Van Elshocht, Sven; Caymax, Matty; Eizenberg, Moshe

Conference

AVS 60th International Symposium & Exhibition

Title

Correlation between current-voltage measurements and the barrier height determined by XPS in Ge p-MOS capacitors

Publication type

Meeting abstract