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Correlation between current-voltage measurements and the barrier height determined by XPS in Ge p-MOS capacitors

dc.contributor.authorFadida, Sivan
dc.contributor.authorPalumbo, F
dc.contributor.authorNyns, Laura
dc.contributor.authorLin, Dennis
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorCaymax, Matty
dc.contributor.authorEizenberg, Moshe
dc.date.accessioned2021-10-21T07:34:13Z
dc.date.available2021-10-21T07:34:13Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22331
dc.sourceIIOimport
dc.titleCorrelation between current-voltage measurements and the barrier height determined by XPS in Ge p-MOS capacitors
dc.typeMeeting abstract
dc.contributor.imecauthorNyns, Laura
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecNyns, Laura::0000-0001-8220-870X
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.source.peerreviewyes
dc.source.beginpage8
dc.source.conferenceAVS 60th International Symposium & Exhibition
dc.source.conferencedate27/10/2013
dc.source.conferencelocationLong Beach, CA USA
dc.identifier.urlhttp://www2.avs.org/symposium/avs60/pdfs/abstractbook.pdf
imec.availabilityPublished - imec


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