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Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI Variability
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Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI Variability
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Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Franco, Jacopo
;
Kaczer, Ben
;
Roussel, Philippe
;
Toledano Luque, Maria
;
Weckx, Pieter
;
Grasser, Tibor
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Acq. date: 2025-12-16
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Views
1808
since deposited on 2021-10-21
1
last month
Acq. date: 2025-12-16
Citations