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Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI Variability
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Authors
Franco, Jacopo
;
Kaczer, Ben
;
Roussel, Philippe
;
Toledano Luque, Maria
;
Weckx, Pieter
;
Grasser, Tibor
Conference
IEEE International Integrated Reliability Workshop - IIRW
Title
Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI Variability
Publication type
Proceedings paper
Embargo date
9999-12-31
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