Superior reliability of high mobility (Si)Ge channel pMOSFETs

Thumbnail
View/open
Metadata
Show full item record
Authors
Franco, Jacopo; Kaczer, Ben; Toledano Luque, Maria; Roussel, Philippe; Cho, Moon Ju; Kauerauf, Thomas; Mitard, Jerome; Eneman, Geert; Witters, Liesbeth; Grasser, Tibor; Groeseneken, Guido
Conference
18th Conference of Insulting Films on Semiconductors - INFOS: Book of Abstracts
Title
Superior reliability of high mobility (Si)Ge channel pMOSFETs
Publication type
Meeting abstract
Embargo date
9999-12-31
Collections