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Understanding correlated drain and gate current fluctuations

dc.contributor.authorGoes, W.
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorBaumgartner, O.
dc.contributor.authorBina, M.
dc.contributor.authorSchanovsky, F.
dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, T.
dc.date.accessioned2021-10-21T07:52:48Z
dc.date.available2021-10-21T07:52:48Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22404
dc.sourceIIOimport
dc.titleUnderstanding correlated drain and gate current fluctuations
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage51
dc.source.endpage56
dc.source.conference20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA
dc.source.conferencedate15/07/2013
dc.source.conferencelocationSuzhou China
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6599125
imec.availabilityPublished - open access


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