A comprehensive model for correlated drain and gate current fluctuations

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Authors
Goes, Wolfgang; Toledano Luque, Maria; Baumgartner, O.; Schanovsky, Frank; Kaczer, Ben; Grasser, Tibor
Conference
16th International Workshop on Computational Electronics - IWCE
Title
A comprehensive model for correlated drain and gate current fluctuations
Publication type
Proceedings paper
Embargo date
9999-12-31
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