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A comprehensive model for correlated drain and gate current fluctuations

dc.contributor.authorGoes, Wolfgang
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorBaumgartner, O.
dc.contributor.authorSchanovsky, Frank
dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.date.accessioned2021-10-21T07:53:03Z
dc.date.available2021-10-21T07:53:03Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22405
dc.sourceIIOimport
dc.titleA comprehensive model for correlated drain and gate current fluctuations
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage46
dc.source.endpage47
dc.source.conference16th International Workshop on Computational Electronics - IWCE
dc.source.conferencedate4/06/2013
dc.source.conferencelocationNara Japan
imec.availabilityPublished - open access


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