Authors

Hatta, S. W. M.; Ji, J.; Zhang, J. F.; Duan, M.; Zhang, W. D.; Soin, N.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido

ISSN

0018-9383

Issue

5

Journal

IEEE Transactions on Electron Devices

Volume

60

Title

Energy distribution of positive charges in gate dielectric: probing technique and impacts of different defects

Publication type

Journal article