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Bias temperature instability analysis in SRAM decoder

dc.contributor.authorKhan, Seyab
dc.contributor.authorHamdioui, Said
dc.contributor.authorKukner, Halil
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-21T08:50:23Z
dc.date.available2021-10-21T08:50:23Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22597
dc.sourceIIOimport
dc.titleBias temperature instability analysis in SRAM decoder
dc.typeProceedings paper
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.conference18th IEEE European Test Symposium - ETS
dc.source.conferencedate27/05/2013
dc.source.conferencelocationAvignon France
dc.identifier.urlhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6569381
imec.availabilityPublished - open access


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