Authors

Vanalme, G. M.; Van Meirhaeghe, R. L.; Cardon, F.; Van Daele, Peter

Journal

Semiconductor Science and Technology

Volume

12

Title

A ballistic electron emission microscopy (BEEM) study of the barrier height change of Au/n-GaAs Schottky barriers due to reactive ion etching

Publication type

Journal article

Embargo date

9999-12-31