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A ballistic electron emission microscopy (BEEM) study of the barrier height change of Au/n-GaAs Schottky barriers due to reactive ion etching
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1980 since deposited on 2021-09-30
Acq. date: 2025-12-08
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1980 since deposited on 2021-09-30
Acq. date: 2025-12-08
Citations