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Direct imaging of 3D atomic-scale dopant-defect clustering processes in ion-implanted silicon
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Direct imaging of 3D atomic-scale dopant-defect clustering processes in ion-implanted silicon
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Date
2013
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Koelling, Sebastian
;
Richard, Olivier
;
Bender, Hugo
;
Uematsu, M.
;
Schulze, Andreas
;
Zschaetzsch, Gerd
;
Gilbert, Matthieu
;
Vandervorst, Wilfried
Journal
Nano Letters
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1928
since deposited on 2021-10-21
Acq. date: 2025-12-10
Citations
Metrics
Views
1928
since deposited on 2021-10-21
Acq. date: 2025-12-10
Citations