Publication:

1/f noise analysis of replacement metal gate bulk p-type fin field effect transistor

Date

2013-03

Journal article

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Files

26914.pdf 763.13 KB

Author(s)

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Ritzenthaler, Romain

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Togo, Mitsuhiro

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Boccardi, Guillaume

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Ragnarsson, Lars-Ake

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Chiarella, Thomas

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Veloso, Anabela

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Horiguchi, Naoto

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Groeseneken, Guido

Journal

Applied Physics Letters

Statistics

2170 since deposited on 2021-10-21

Acq. date: 2026-07-09