Publication:

Charge retention in a patterned SiO2/Si3N4 electret

Date

2013

Journal article

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Files

25753.pdf 1.47 MB

Author(s)

Leonov, Vladimir

;

van Schaijk, Rob

;

Van Hoof, Chris

Journal

IEEE Sensors Journal

Metrics

1896 since deposited on 2021-10-21

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Acq. date: 2025-12-10