Publication:

Trap spectroscopy and Ta penetration induced charge trapping in Porous SiOCH low-k dielectrics

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1860 since deposited on 2021-10-21
Acq. date: 2026-04-05

Citations

Statistics

Views

1860 since deposited on 2021-10-21
Acq. date: 2026-04-05

Citations