dc.contributor.author | Loo, Roger | |
dc.contributor.author | Hikavyy, Andriy | |
dc.contributor.author | Vincent, Benjamin | |
dc.contributor.author | Witters, Liesbeth | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Rooyackers, Rita | |
dc.contributor.author | Vandooren, Anne | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.contributor.author | Thean, Aaron | |
dc.date.accessioned | 2021-10-21T09:33:11Z | |
dc.date.available | 2021-10-21T09:33:11Z | |
dc.date.issued | 2013 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22722 | |
dc.source | IIOimport | |
dc.title | Epitaxial growth challenges for advanced CMOS devices | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Hikavyy, Andriy | |
dc.contributor.imecauthor | Vincent, Benjamin | |
dc.contributor.imecauthor | Witters, Liesbeth | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Vandooren, Anne | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Hikavyy, Andriy::0000-0002-8201-075X | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Vandooren, Anne::0000-0002-2412-0176 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 165 | |
dc.source.endpage | 166 | |
dc.source.conference | 8th International Conference on Si Epitaxy and Heterostructures - ICSI8 | |
dc.source.conferencedate | 2/06/2013 | |
dc.source.conferencelocation | Fukuoka Japan | |
imec.availability | Published - open access | |