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Towards understanding hole traps and NBTI of Ge/GeO2/Al2O3 structure
Publication:
Towards understanding hole traps and NBTI of Ge/GeO2/Al2O3 structure
Date
2013
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ma, J
;
Zhang, J.F.
;
Ji, Z.
;
Benbakhti, B.
;
Duan, M.
;
Zhang, W.
;
Zheng, X.F.
;
Mitard, Jerome
;
Kaczer, Ben
;
Groeseneken, Guido
;
Hall, S.
;
Robertson, J.
;
Chalker, P.
Journal
Microelectronic Engineering
Abstract
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1968
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations
Metrics
Views
1968
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations