Towards understanding hole traps and NBTI of Ge/GeO2/Al2O3 structure

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Authors

Ma, J; Zhang, J.F.; Ji, Z.; Benbakhti, B.; Duan, M.; Zhang, W.; Zheng, X.F.; Mitard, Jerome; Kaczer, Ben; Groeseneken, Guido; Hall, S.; Robertson, J.; Chalker, P.

ISSN

0167-9317

Journal

Microelectronic Engineering

Volume

109

Title

Towards understanding hole traps and NBTI of Ge/GeO2/Al2O3 structure

Publication type

Journal article

Embargo date

9999-12-31

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