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TEASE: A systematic analysis framework for early evaluation of FinFET-based advanced technology nodes

dc.contributor.authorMallik, Arindam
dc.contributor.authorZuber, Paul
dc.contributor.authorLiu, Tsung-Te
dc.contributor.authorChava, Bharani
dc.contributor.authorBallal, Bhavana
dc.contributor.authorRoyer Del Barrio, Pablo
dc.contributor.authorBaert, Rogier
dc.contributor.authorCroes, Kris
dc.contributor.authorRyckaert, Julien
dc.contributor.authorBadaroglu, Mustafa
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorVerkest, Diederik
dc.date.accessioned2021-10-21T09:45:23Z
dc.date.available2021-10-21T09:45:23Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22755
dc.sourceIIOimport
dc.titleTEASE: A systematic analysis framework for early evaluation of FinFET-based advanced technology nodes
dc.typeProceedings paper
dc.contributor.imecauthorMallik, Arindam
dc.contributor.imecauthorZuber, Paul
dc.contributor.imecauthorBaert, Rogier
dc.contributor.imecauthorRyckaert, Julien
dc.contributor.imecauthorBadaroglu, Mustafa
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.orcidimecMallik, Arindam::0000-0002-0742-9366
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conference50th ACM/EDAC/IEEE Design Automation Conference - DAC
dc.source.conferencedate2/06/2013
dc.source.conferencelocationAustin, TX USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6560617&punumber%3D6556118%26sortType%3Dasc_p_Sequence%26filter%3DAND
imec.availabilityPublished - open access


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