Authors

Marcon, Denis; Viaene, John; Favia, Paola; Bender, Hugo; Kang, Xuanwu; Lenci, Silvia; Stoffels, Steve; Decoutere, Stefaan

Conference

20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA

Title

Reliability of AlGaN/GaN HEMTs: permanent leakage current increase and output current drop

Publication type

Proceedings paper

Embargo date

9999-12-31