Publication:
Ron collapse, breakdown and degradation of d-mode MIS-HEMTs based on GaN on Si technology
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1957 since deposited on 2021-10-21
2last month
Acq. date: 2026-01-08
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Metrics
Views
1957 since deposited on 2021-10-21
2last month
Acq. date: 2026-01-08
Citations