Ron collapse, breakdown and degradation of d-mode MIS-HEMTs based on GaN on Si technology

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Authors
Meneghini, Matteo; Bisi, Davide; Marcon, Denis; Stoffels, Steve; Van Hove, Marleen; Wu, Tian-Li; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico
Conference
10th International Conference on Nitride Semiconductors - ICNS
Title
Ron collapse, breakdown and degradation of d-mode MIS-HEMTs based on GaN on Si technology
Publication type
Oral presentation
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