dc.contributor.author | Nag, Manoj | |
dc.contributor.author | Steudel, Soeren | |
dc.contributor.author | Vaisman Chasin, Adrian | |
dc.contributor.author | Myny, Kris | |
dc.contributor.author | Rockele, Maarten | |
dc.contributor.author | Bhoolokam, Ajay | |
dc.contributor.author | Willegems, Myriam | |
dc.contributor.author | Smout, Steve | |
dc.contributor.author | Vicca, Peter | |
dc.contributor.author | Ameys, Marc | |
dc.contributor.author | Schols, Sarah | |
dc.contributor.author | Genoe, Jan | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Heremans, Paul | |
dc.date.accessioned | 2021-10-21T10:19:10Z | |
dc.date.available | 2021-10-21T10:19:10Z | |
dc.date.issued | 2013 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22842 | |
dc.source | IIOimport | |
dc.title | Back-channel-etch process flow for a-IGZO TFTs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Nag, Manoj | |
dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
dc.contributor.imecauthor | Myny, Kris | |
dc.contributor.imecauthor | Willegems, Myriam | |
dc.contributor.imecauthor | Smout, Steve | |
dc.contributor.imecauthor | Ameys, Marc | |
dc.contributor.imecauthor | Schols, Sarah | |
dc.contributor.imecauthor | Genoe, Jan | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Heremans, Paul | |
dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
dc.contributor.orcidimec | Myny, Kris::0000-0002-5230-495X | |
dc.contributor.orcidimec | Smout, Steve::0000-0001-5464-8951 | |
dc.contributor.orcidimec | Ameys, Marc::0000-0001-7140-2101 | |
dc.contributor.orcidimec | Genoe, Jan::0000-0002-4019-5979 | |
dc.contributor.orcidimec | Heremans, Paul::0000-0003-2151-1718 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 285 | |
dc.source.endpage | 288 | |
dc.source.conference | Euro Display Conference | |
dc.source.conferencedate | 16/09/2013 | |
dc.source.conferencelocation | London UK | |
dc.identifier.url | http://onlinelibrary.wiley.com/doi/10.1002/sdtp.83/abstract | |
imec.availability | Published - imec | |