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Relationship between resist outgassing and witness sample contamination in NXE outgas qualification using electrons and EUV
Publication:
Relationship between resist outgassing and witness sample contamination in NXE outgas qualification using electrons and EUV
Date
2013
Proceedings Paper
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26402.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pollentier, Ivan
;
Lokasani, Ragava
;
Gronheid, Roel
;
Hill, S.
;
Tarrio, C.
;
Lucatorto, T.
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1871
since deposited on 2021-10-21
Acq. date: 2025-10-27
Citations
Metrics
Views
1871
since deposited on 2021-10-21
Acq. date: 2025-10-27
Citations