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Microscopic origin of random telegraph noise fluctuations in aggressively scaled RRAM and its impact on read disturb variability

dc.contributor.authorRaghavan, Naga
dc.contributor.authorDegraeve, Robin
dc.contributor.authorFantini, Andrea
dc.contributor.authorGoux, Ludovic
dc.contributor.authorStrangio, Sebastiano
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorWouters, Dirk
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-21T11:12:36Z
dc.date.available2021-10-21T11:12:36Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22970
dc.sourceIIOimport
dc.titleMicroscopic origin of random telegraph noise fluctuations in aggressively scaled RRAM and its impact on read disturb variability
dc.typeProceedings paper
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage5E.3
dc.source.conferenceInternational Reliability Physics Symposium - IRPS
dc.source.conferencedate14/04/2013
dc.source.conferencelocationMonterey, CA USA
imec.availabilityPublished - open access


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