Statistical insight into controlled forming and forming free stacks for HfOx RRAM

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Authors
Raghavan, Naga; Fantini, Andrea; Degraeve, Robin; Roussel, Philippe; Goux, Ludovic; Wouters, Dirk; Groeseneken, Guido; Jurczak, Gosia
ISSN
0167-9317
Journal
Microelectronic Engineering
Volume
109
Title
Statistical insight into controlled forming and forming free stacks for HfOx RRAM
Publication type
Journal article
Embargo date
9999-12-31
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