Authors

Schulze, Andreas; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Vandervorst, Wilfried

ISSN

0304-3991

Issue

1

Journal

Ultramicroscopy

Volume

125

Title

Quantitative three-dimensional carrier mapping in nanowire-based transistors using scanning spreading resistance microscopy

Publication type

Journal article