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Tunnel emission for Co and Cr related levels in p-type Ge

dc.contributor.authorSegers, Siegfried
dc.contributor.authorLauwaert, Johan
dc.contributor.authorClauws, Paul
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorCallens, Freddy
dc.contributor.authorVrielinck, Henk
dc.date.accessioned2021-10-21T11:55:47Z
dc.date.available2021-10-21T11:55:47Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23066
dc.sourceIIOimport
dc.titleTunnel emission for Co and Cr related levels in p-type Ge
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage1
dc.source.conferenceInternational Conference on Defects in Semiconductors
dc.source.conferencedate15/07/2013
dc.source.conferencelocationBologna Italy
imec.availabilityPublished - imec


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