Publication:

Low-frequency-noise-based oxide trap profiling in replacement high-k/metal-gate pMOSFETs

Date

2013

Meeting abstract

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Files

26924.pdf 32.82 KB

Author(s)

;

;

Veloso, Anabela

;

Paraschiv, Vasile

;

Horiguchi, Naoto

;

Statistics

1954 since deposited on 2021-10-21

Acq. date: 2026-02-25