Border traps in Ge/III-V channel devices: Analysis and reliability aspects

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Authors

Simoen, Eddy; Lin, Dennis; Alian, AliReza; Brammertz, Guy; Merckling, Clement; Mitard, Jerome; Claeys, Cor

ISSN

1530-4388

Issue

4

Journal

IEEE Transactions on Device and Materials Reliability

Volume

13

Title

Border traps in Ge/III-V channel devices: Analysis and reliability aspects

Publication type

Journal article

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