Publication:
Analytical model for anomalous positive bias temperature instability in La-based HfO2 nFETs based on independent characterization of charging components
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1984 since deposited on 2021-10-21
2last month
2last week
Acq. date: 2026-02-25
Citations
Statistics
Views
1984 since deposited on 2021-10-21
2last month
2last week
Acq. date: 2026-02-25
Citations