Publication:
Analytical model for anomalous positive bias temperature instability in La-based HfO2 nFETs based on independent characterization of charging components
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1987 since deposited on 2021-10-21
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Acq. date: 2026-07-16
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Statistics
Views
1987 since deposited on 2021-10-21
3last month
3last week
Acq. date: 2026-07-16
Citations