Degradation of time dependent variability due to interface state generation

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Authors
Toledano Luque, Maria; Kaczer, Ben; Franco, Jacopo; Roussel, Philippe; Bina, Markus; Grasser, Tibor; Cho, Moon Ju; Weckx, Pieter; Groeseneken, Guido
Conference
Symposium on VLSI Technology
Title
Degradation of time dependent variability due to interface state generation
Publication type
Proceedings paper
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