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Degradation of time dependent variability due to interface state generation

dc.contributor.authorToledano Luque, Maria
dc.contributor.authorKaczer, Ben
dc.contributor.authorFranco, Jacopo
dc.contributor.authorRoussel, Philippe
dc.contributor.authorBina, Markus
dc.contributor.authorGrasser, Tibor
dc.contributor.authorCho, Moon Ju
dc.contributor.authorWeckx, Pieter
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-21T12:48:06Z
dc.date.available2021-10-21T12:48:06Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23176
dc.sourceIIOimport
dc.titleDegradation of time dependent variability due to interface state generation
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.source.peerreviewyes
dc.source.beginpageT190
dc.source.endpageT191
dc.source.conferenceSymposium on VLSI Technology
dc.source.conferencedate11/06/2013
dc.source.conferencelocationKyoto Japan
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6576648&queryText%3DDegradation+of+time+dependent+variability+due
imec.availabilityPublished - imec


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