dc.contributor.author | Vais, Abhitosh | |
dc.contributor.author | Lin, Dennis | |
dc.contributor.author | Dou, Chunmeng | |
dc.contributor.author | Yuan, Yu | |
dc.contributor.author | Martens, Koen | |
dc.contributor.author | Ivanov, Tsvetan | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | De Meyer, Kristin | |
dc.contributor.author | Thean, Aaron | |
dc.contributor.author | Taur, Yuan | |
dc.date.accessioned | 2021-10-21T13:07:39Z | |
dc.date.available | 2021-10-21T13:07:39Z | |
dc.date.issued | 2013 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23216 | |
dc.source | IIOimport | |
dc.title | On the temperature dependence of frequency dispersion in C-V measurements of III-V MOS devices and its application in spatial profiling of border traps | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Vais, Abhitosh | |
dc.contributor.imecauthor | Lin, Dennis | |
dc.contributor.imecauthor | Martens, Koen | |
dc.contributor.imecauthor | Ivanov, Tsvetan | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Vais, Abhitosh::0000-0002-0317-7720 | |
dc.contributor.orcidimec | Martens, Koen::0000-0001-7135-5536 | |
dc.contributor.orcidimec | Ivanov, Tsvetan::0000-0003-3407-2742 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.source.peerreview | no | |
dc.source.conference | 44th IEEE Semiconductor Interface Specialists Conference | |
dc.source.conferencedate | 5/12/2013 | |
dc.source.conferencelocation | Arlington, VA USA | |
imec.availability | Published - imec | |