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High throughput grating qualification of directed self-assembly patterns using optical metrology
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Authors
Van Look, Lieve
;
Rincon Delgadillo, Paulina
;
Lee, Yu-tsung
;
Pollentier, Ivan
;
Gronheid, Roel
;
Cao, Yi
;
Lin, Guanyang
;
Nealey, Paul F.
Conference
39th International Conference on Micro and Nano Engineering - MNE
Title
High throughput grating qualification of directed self-assembly patterns using optical metrology
Publication type
Oral presentation
Embargo date
9999-12-31
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