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Root-cause analysis of device failure in inverted P3HT:PCBM cells

dc.contributor.authorVoroshazi, Eszter
dc.contributor.authorUytterhoeven, Griet
dc.contributor.authorFavia, Paola
dc.contributor.authorCnops, Kjell
dc.contributor.authorCheyns, David
dc.date.accessioned2021-10-21T14:21:23Z
dc.date.available2021-10-21T14:21:23Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23364
dc.sourceIIOimport
dc.titleRoot-cause analysis of device failure in inverted P3HT:PCBM cells
dc.typeProceedings paper
dc.contributor.imecauthorVoroshazi, Eszter
dc.contributor.imecauthorUytterhoeven, Griet
dc.contributor.imecauthorFavia, Paola
dc.contributor.imecauthorCheyns, David
dc.contributor.orcidimecUytterhoeven, Griet::0000-0001-7052-2590
dc.contributor.orcidimecFavia, Paola::0000-0002-1019-3497
dc.contributor.orcidimecCheyns, David::0000-0002-1327-8752
dc.source.peerreviewno
dc.source.conferenceInternational Summit on Organic Photolvtaic Stability
dc.source.conferencedate10/12/2013
dc.source.conferencelocationChambery France
imec.availabilityPublished - imec


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