dc.contributor.author | Wang, Teng | |
dc.contributor.author | Silva, J.L. | |
dc.contributor.author | Daily, Robert | |
dc.contributor.author | Capuz, Giovanni | |
dc.contributor.author | Gonzalez, Mario | |
dc.contributor.author | Rebibis, Kenneth June | |
dc.contributor.author | Kroehnert, S. | |
dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2021-10-21T14:28:33Z | |
dc.date.available | 2021-10-21T14:28:33Z | |
dc.date.issued | 2013 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23378 | |
dc.source | IIOimport | |
dc.title | Wafer reconstruction: An alternative 3D integration process flow | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Capuz, Giovanni | |
dc.contributor.imecauthor | Gonzalez, Mario | |
dc.contributor.imecauthor | Rebibis, Kenneth June | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Capuz, Giovanni::0000-0002-5263-4836 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.source.peerreview | yes | |
dc.source.conference | 2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013) | |
dc.source.conferencedate | 12/12/2013 | |
dc.source.conferencelocation | Singapore Singapore | |
dc.identifier.url | https://ieeexplore.ieee.org/document/6745754 | |
imec.availability | Published - imec | |