Authors

Weckx, Pieter; Kaczer, Ben; Toledano Luque, Maria; Grasser, Tibor; Roussel, Philippe; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky; Groeseneken, Guido

Conference

IEEE International Reliability Physics Symposium - IRPS

Title

Defect-based methodology for workload-dependent circuit lifetime projections – application to SRAM

Publication type

Proceedings paper

Embargo date

9999-12-31