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Defect-based methodology for workload-dependent circuit lifetime projections – application to SRAM
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Defect-based methodology for workload-dependent circuit lifetime projections – application to SRAM
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Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Weckx, Pieter
;
Kaczer, Ben
;
Toledano Luque, Maria
;
Grasser, Tibor
;
Roussel, Philippe
;
Kukner, Halil
;
Raghavan, Praveen
;
Catthoor, Francky
;
Groeseneken, Guido
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1915
since deposited on 2021-10-21
2
last month
Acq. date: 2026-02-25
Citations