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Efficient reliability testing of emerging memory technologies using multiple radiation sources

dc.contributor.authorBennet, W.G.
dc.contributor.authorHooten, N.C.
dc.contributor.authorWeeded-Wright, S.
dc.contributor.authorSchrimpf, R.D.
dc.contributor.authorReed, R.A.
dc.contributor.authorAlles, M.C.
dc.contributor.authorZhang, E.X.
dc.contributor.authorMc Curdy, M.W.
dc.contributor.authorLinten, Dimitri
dc.contributor.authorJurczak, Gosia
dc.contributor.authorFantini, Andrea
dc.date.accessioned2021-10-22T00:45:51Z
dc.date.available2021-10-22T00:45:51Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23535
dc.sourceIIOimport
dc.titleEfficient reliability testing of emerging memory technologies using multiple radiation sources
dc.typeProceedings paper
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorFantini, Andrea
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage8
dc.source.conference23rd Conference on Application of Accelerators in Research and Industry - CAARI
dc.source.conferencedate25/05/2014
dc.source.conferencelocationSan Antonio, TX USA
imec.availabilityPublished - imec
imec.internalnotesPhysics Procedia


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