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Experimental study of programming saturation in low-coupling planar high-k/metal gate Nand flash memory cells using a dedicated test structure
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1937 since deposited on 2021-10-22
1last month
Acq. date: 2026-06-02
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Views
1937 since deposited on 2021-10-22
1last month
Acq. date: 2026-06-02
Citations