Authors

Blomme, Pieter; Tan, Chi Lim; Souriau, Laurent; Versluijs, Janko; Van den Bosch, Geert; Van Houdt, Jan

Conference

IEEE 6th International Memory Workshop - IMW

Title

Experimental study of programming saturation in low-coupling planar high-k/metal gate Nand flash memory cells using a dedicated test structure

Publication type

Proceedings paper

Embargo date

9999-12-31