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Analog performance of standard and uinaxial strained triple-gate SOI FinFET under X-ray radiation
Publication:
Analog performance of standard and uinaxial strained triple-gate SOI FinFET under X-ray radiation
Date
2014
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bordallo, Caio
;
Teixeira, Fernando
;
Silveira, Marcilei
;
Agopian, Paula G.D.
;
Martino, Joao A.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Semiconductor Science and Technology
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1898
since deposited on 2021-10-22
Acq. date: 2025-10-29
Citations
Metrics
Views
1898
since deposited on 2021-10-22
Acq. date: 2025-10-29
Citations