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Analog performance of standard and uinaxial strained triple-gate SOI FinFET under X-ray radiation
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Authors
Bordallo, Caio
;
Teixeira, Fernando
;
Silveira, Marcilei
;
Agopian, Paula G.D.
;
Martino, Joao A.
;
Simoen, Eddy
;
Claeys, Cor
ISSN
0268-1242
Issue
12
Journal
Semiconductor Science and Technology
Volume
29
Title
Analog performance of standard and uinaxial strained triple-gate SOI FinFET under X-ray radiation
Publication type
Journal article
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