dc.contributor.author | Bury, Erik | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Cho, Moon Ju | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Goes, Wolfang | |
dc.contributor.author | Grasser, Tibor | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-22T00:50:47Z | |
dc.date.available | 2021-10-22T00:50:47Z | |
dc.date.issued | 2014 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23594 | |
dc.source | IIOimport | |
dc.title | Investigation of correlated trap sites in SILC, BTI and RTN in SiON and HKMG devices | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Bury, Erik | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.source.peerreview | no | |
dc.source.conference | 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA | |
dc.source.conferencedate | 30/05/2014 | |
dc.source.conferencelocation | Singapore Singapore | |
imec.availability | Published - imec | |