Publication:
Study of (correlated) trap sites in SILC, BTI and RTN in SiON and HKMG devices
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1818 since deposited on 2021-10-22
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Acq. date: 2026-01-11
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Views
1818 since deposited on 2021-10-22
1last month
1last week
Acq. date: 2026-01-11
Citations