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Reliability of 3D package using wafer level underfill and low CTE epoxy mold compound materials
Publication:
Reliability of 3D package using wafer level underfill and low CTE epoxy mold compound materials
Date
2014
Proceedings Paper
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29942.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cadacio Jr., Francisco
;
Rebibis, Kenneth June
;
Capuz, Giovanni
;
Daily, Robert
;
Gerets, Carine
;
Duval, Fabrice
;
Wang, Teng
;
Miller, Andy
;
Beyer, Gerald
;
Beyne, Eric
Journal
Abstract
Description
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Views
1996
since deposited on 2021-10-22
Acq. date: 2025-10-28
Citations
Metrics
Views
1996
since deposited on 2021-10-22
Acq. date: 2025-10-28
Citations