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Measurements of millimeter wave test structures for high speed chip testing

dc.contributor.authorDe Keulenaer, Timothy
dc.contributor.authorBan, Yu
dc.contributor.authorTorfs, Guy
dc.contributor.authorSercu, S.
dc.contributor.authorDe Geest, Jan
dc.contributor.authorBauwelinck, Johan
dc.date.accessioned2021-10-22T01:06:21Z
dc.date.available2021-10-22T01:06:21Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23706
dc.sourceIIOimport
dc.titleMeasurements of millimeter wave test structures for high speed chip testing
dc.typeProceedings paper
dc.contributor.imecauthorTorfs, Guy
dc.contributor.imecauthorBauwelinck, Johan
dc.contributor.orcidimecTorfs, Guy::0000-0003-1817-5370
dc.contributor.orcidimecBauwelinck, Johan::0000-0001-5254-2408
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conference18th IEEE Workshop on Signal and Power Integrity - SPI
dc.source.conferencedate11/05/2014
dc.source.conferencelocationGent Belgie
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6844529
imec.availabilityPublished - open access


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