Measurements of millimeter wave test structures for high speed chip testing

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Authors
De Keulenaer, Timothy; Ban, Yu; Torfs, Guy; Sercu, S.; De Geest, Jan; Bauwelinck, Johan
Conference
18th IEEE Workshop on Signal and Power Integrity - SPI
Title
Measurements of millimeter wave test structures for high speed chip testing
Publication type
Proceedings paper
Embargo date
9999-12-31
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