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Measurements of millimeter wave test structures for high speed chip testing
Publication:
Measurements of millimeter wave test structures for high speed chip testing
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Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Keulenaer, Timothy
;
Ban, Yu
;
Torfs, Guy
;
Sercu, S.
;
De Geest, Jan
;
Bauwelinck, Johan
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1851
since deposited on 2021-10-22
1
last month
1
last week
Acq. date: 2026-01-25
Citations