Publication:

Measurements of millimeter wave test structures for high speed chip testing

Date

2014
Proceedings Paper
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0001-5254-2408
cris.virtual.orcid0000-0003-1817-5370
cris.virtualsource.department2d516324-9d3d-4a9a-a845-390cea4ffe11
cris.virtualsource.departmentb495c208-a27d-49b2-a309-8acaef1f1428
cris.virtualsource.orcid2d516324-9d3d-4a9a-a845-390cea4ffe11
cris.virtualsource.orcidb495c208-a27d-49b2-a309-8acaef1f1428
dc.contributor.authorDe Keulenaer, Timothy
dc.contributor.authorBan, Yu
dc.contributor.authorTorfs, Guy
dc.contributor.authorSercu, S.
dc.contributor.authorDe Geest, Jan
dc.contributor.authorBauwelinck, Johan
dc.contributor.imecauthorTorfs, Guy
dc.contributor.imecauthorBauwelinck, Johan
dc.contributor.orcidimecTorfs, Guy::0000-0003-1817-5370
dc.contributor.orcidimecBauwelinck, Johan::0000-0001-5254-2408
dc.date.accessioned2021-10-22T01:06:21Z
dc.date.available2021-10-22T01:06:21Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23706
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6844529
dc.source.beginpage1
dc.source.conference18th IEEE Workshop on Signal and Power Integrity - SPI
dc.source.conferencedate11/05/2014
dc.source.conferencelocationGent Belgie
dc.source.endpage4
dc.title

Measurements of millimeter wave test structures for high speed chip testing

dc.typeProceedings paper
dspace.entity.typePublication
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