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Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics
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Authors
Dos Santos, Sara
;
Cretu, Bogdan
;
Strobel, Vincent
;
Routoure, Jean-Marc
;
Carin, Regis
;
Martino, Joao Antonio
;
Aoulaiche, Marc
;
Simoen, Eddy
;
Claeys, Cor
ISSN
0038-1101
Journal
Solid-State Electronics
Volume
97
Title
Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics
Publication type
Journal article
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