Publication:

Impact of stressors in future SiGe-based FinFETs: mobility boost and scalability

Date

2014

Proceedings Paper

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Files

29096.pdf 946.59 KB

Author(s)

;

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Witters, Liesbeth

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Hikavyy, Andriy

;

De Keersgieter, An

;

Roussel, Philippe

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;

Veloso, Anabela

;

Horiguchi, Naoto

;

Collaert, Nadine

;

Statistics

1837 since deposited on 2021-10-22

Acq. date: 2026-02-25