Publication:

Impact of stressors in future SiGe-based FinFETs: mobility boost and scalability

Date

2014
Proceedings Paper
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Author(s)

Eneman, Geert  
;
Brunco, David
;
Witters, Liesbeth  
;
Mitard, Jerome  
;
Hikavyy, Andriy  
;
De Keersgieter, An  
;
Roussel, Philippe  
;
Loo, Roger  
;
Veloso, Anabela  
;
Horiguchi, Naoto  
;
Collaert, Nadine  
;
Thean, Aaron  

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