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Distinction between silicon and oxide traps using single-trap spectroscopy
Publication:
Distinction between silicon and oxide traps using single-trap spectroscopy
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fang, Wen
;
Simoen, Eddy
;
Aoulaiche, Marc
;
Luo, Jun
;
Zhao, Chao
;
Claeys, Cor
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Abstract
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1900
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Acq. date: 2025-12-10
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Metrics
Views
1900
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-10
Citations