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Distinction between silicon and oxide traps using single-trap spectroscopy

dc.contributor.authorFang, Wen
dc.contributor.authorSimoen, Eddy
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorLuo, Jun
dc.contributor.authorZhao, Chao
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-22T01:25:34Z
dc.date.available2021-10-22T01:25:34Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23804
dc.sourceIIOimport
dc.titleDistinction between silicon and oxide traps using single-trap spectroscopy
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conferenceE-MRS Spring Meeting Symposium H: Analytical Techniques for Precise Characterization of Nanomaterials - ALTECH
dc.source.conferencedate26/05/2014
dc.source.conferencelocationLille France
imec.availabilityPublished - imec


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