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Study of DID/ID of a single charge trap in UTBOX silicon films
Publication:
Study of DID/ID of a single charge trap in UTBOX silicon films
Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fang, Wen
;
Simoen, Eddy
;
Aoulaiche, Marc
;
Luo, Jun
;
Zhao, Chao
;
Claeys, Cor
Journal
Abstract
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1965
since deposited on 2021-10-22
438
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1965
since deposited on 2021-10-22
438
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations